Emerging Capabilities in Materials Characterization using Electron Microscope

Modern electron microscopes are critical tools for furthering nanoscience and nanomaterials research. Ultra low kV imaging today allows for high resolution imaging even of beam sensitive samples.
2D analytical characterization technologies combined with 3D imaging and in situ capabilities, equips researchers with an unparalleled toolkit to pioneer solutions. These capabilities can be pushed further by combining innovative software packages for modeling, simulation, and artificial intelligence.
SEMs are also an ideal platform to integrate methods for quantitative compositional analysis of material samples. The instrumentation used in Energy Dispersive Spectrometry (EDS) and Electron backscattered Electron Diffraction (EBSD) has evolved continuously over the last number of years however very recently there have been some dramatic changes in the technology which have resulted in a step change in performance with respect to speed, sensitivity and ease of use.

For EDS, the switch from conventional Si(Li) technology to silicon drift detectors has resulted in a huge improvement in performance with the opportunity for higher speed, better spectral resolution and of course the convenience of non-LN2 cooling, however challenges still exist such as with beam sensitive samples, in applications where ultimate analytical spatial resolution is required and / or where the very best light element, low energy performance is needed. Oxford Instruments’ latest technology provides solutions with unique very large area sensors and windowless detectors both of which can deliver solutions beyond conventional nano-analysis in the SEM or FIBSEM.

EBSD has become a well-established accessory for the SEM and is now applied in numerous different application areas to assist in materials characterisation. Modern CMOS detectors offer the best performance on all types of samples and are ideally suited to more advanced applications such as in-situ analysis, 3D-EBSD and TKD.

This talk will illustrate how these revolutionary new technologies can benefit applications in advanced materials science, renewable energy and earth sciences.

Key Learnings

  • Utilize modern microscopy to enhance your materials science research with emerging techniques and applications in ultra low kV imaging, 3D STEM Tomography and Nano-fabrication .
  • Find out how the latest generation of EDS hardware and software enables live colour navigation in the SEM and allow surface-sensitive measurements of materials to resolve EDS data at the nanoscale.
  • Discover how CMOS based detectors are changing the way we do EBSD & TKD.

16th September 2021 | 3PM NZST

Register for the webinar now!

Speakers

Dr. Chuan Wei Chung

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Electron Microscope Application Specialist for APAC, Carl Zeiss Pte Ltd

Dr. Chuan Wei Chung is an Application Specialist for the Electron Microscopy with ZEISS Research Microscopy Solutions in Asia Pacific. He graduated from the University of Auckland, New Zealand. His research looked into the effect of severe plastic deformation through Equal Channel Angular Pressing (ECAP) on the microstructures and mechanical properties of magnesium alloys. He has vast application experiences in X-ray microanalysis in SEMs and TEMs, as well as EBSD and TKD characterizations in SEMs.

Dr Julie Sheffield-Parker

Director of Nanospec Pty Ltd

Julie is Director and co-owner of Nanospec Pty Ltd, the sole distributor for Oxford Instruments NanoAnalysis products in Australia, New Zealand and neighbouring Pacific Islands. She holds a First Class Honours degree in Mineral Processing and a Ph.D. from the Camborne School of Mines in the UK. Julie developed an interest in electron microscopy during her Ph.D. studies and since then has been involved in micro-nano characterisation and analytical techniques for more than 30 years, specialising in Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS) and Electron Backscattered Diffraction (EBSD).