![]({"xsmall":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.100.100.112,129,975,992.file/unsw.png","small":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.360.360.112,129,975,992.file/unsw.png","medium":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.768.768.112,129,975,992.file/unsw.png","large":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.863.863.112,129,975,992.file/unsw.png","xlarge":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.863.863.112,129,975,992.file/unsw.png","xxlarge":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.863.863.112,129,975,992.file/unsw.png","max":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw.png/_jcr_content/renditions/original.image_file.863.863.112,129,975,992.file/unsw.png"})
ZEISS On Your Campus
Latest Innovations in Non-destructive 3D X-ray Microscopy for the Modern Analytical Laboratory
Live Seminar & Workshop at UNSW Sydney
This seminar will explore the emerging research applications, along with underlying technology and methodology, stemming from 3D X-ray microscopy (XRM). As a non-destructive characterisation method, XRM allows us to uniquely evaluate the internal structures of our samples and specimens at sub-micron resolution, covering multiple contrast mechanisms and length scales. Moreover, 4D investigation of structures via in-situ or ex-situ repeated imaging provides new opportunities for understanding materials evolution and degradation processes, and correlative workflows linking XRM with other modalities such as SEM, FIB-SEM, or APT offer the chance to easily span across a range of length scales. Several examples will be presented, emphasising the latest developments and an outlook towards the future.
Starting soon
- 00 years
- 00 months
- 00 days
- 00 hours
- 00 minutes
- 00 seconds
![]({"xsmall":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.100.67.114,212,976,787.file/unsw_2.png","small":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.360.240.114,212,976,787.file/unsw_2.png","medium":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.768.512.114,212,976,787.file/unsw_2.png","large":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.862.575.114,212,976,787.file/unsw_2.png","xlarge":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.862.575.114,212,976,787.file/unsw_2.png","xxlarge":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.862.575.114,212,976,787.file/unsw_2.png","max":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/unsw_2.png/_jcr_content/renditions/original.image_file.862.575.114,212,976,787.file/unsw_2.png"})
Agenda
Key Learnings
Join us to learn about:
- How X-ray microscopy drives advances in Materials Science and Life Science, including non-destructive views of deeply buried features, compositional contrast for studying challenging materials, and the ability to maintain Resolution at a Distance for in situ imaging.
- How Laboratory Diffraction Contrast Tomography (LabDCT) allows for comprehensive characterisation of grain morphology and boundaries in metals, alloys, and ceramics, overcoming challenges in analysing 3D crystallographic microstructures without sectioning.
- How X-ray microscopy can be integrated into broader workflows to streamline the collection of meaningful data and enhance research efficiency
|
Agenda
|
|
|---|---|
|
11.00AM - 12.00PM |
Seminar |
|
12.00PM - 1.00PM |
Q&A Roundtable Discussion (for interested attendees) |
![]({"xsmall":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.100.100.65,23,436,394.file/lunazhang.jpg","small":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.360.360.65,23,436,394.file/lunazhang.jpg","medium":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.371.371.65,23,436,394.file/lunazhang.jpg","large":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.371.371.65,23,436,394.file/lunazhang.jpg","xlarge":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.371.371.65,23,436,394.file/lunazhang.jpg","xxlarge":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.371.371.65,23,436,394.file/lunazhang.jpg","max":"https://www.zeiss.com.au/content/dam/rms/countries/australia/zoyc-2025/lunazhang.jpg/_jcr_content/renditions/original.image_file.371.371.65,23,436,394.file/lunazhang.jpg"})
Speaker
Luna Zhang
Luna Zhang holds a Master of Science in Material Science and Engineering from the National University of Singapore, specializing in nanomaterials. With a strong background in technology, Luna has worked as a Failure Analysis Engineer at Micron Technology. Currently, she is an APAC X-ray Microscope Product Application Sales Specialist, where she leverages her technical expertise to drive product applications covering various topics across the Asia-Pacific region.
Register for the ZOYC UNSW Workshop here
Fill in the form below to register