New Techniques, Classical Problems: Advancing Materials Research Through Latest Innovations In X-Ray Microscopy

As a nondestructive characterization method, XRM allows us to uniquely evaluate the internal structures of our samples and specimens at sub-micron resolution, covering multiple contrast mechanisms and length scales. Moreover, 4D investigation of structures via in situ or ex-situ repeated imaging provides new opportunities for understanding materials evolution/degradation processes, and correlative workflows linking XRM with other modalities such as EM or FIB-SEM offer the chance to easily span across a range of length scales. Several examples will be presented, emphasizing the latest developments and an outlook towards the future.